Ion-induced electron emission patterns in condensed matter

Ballistic-electron-emission microscopy of strain nonuniformities in Si1-xGex/Si structures.

Ballistic-electron-emission microscopy (BEEM) is used to probe local conduction-band structure in strained Sil .xGq layers of pseudomorphic Sil-xGe#Si heterostmctires. The strain variation produced by a roughened Si l.xGex surface is seen as a variation of splitting between thresholds in BEEM spectroscopy. This splitting is directly related to the strain-induced conduction-band splitting in the...

Temporary negative-ion resonances in the NiO(100) high-resolution electron-energy-loss spectrum.

Electron pair emission from a W(001) surface: photon versus electron excitation.

The electron pair emission from a W(001) surface was studied using a coincidence time-of-flight spectrometer. The aim of this study was to compare the pair emission upon electron impact and upon photon absorption. The energy distributions are markedly different for these two experiments. From this we conclude that the photon-stimulated pair emission carries a significant contribution from a dou...

Ion-beam mixing induced by atomic and cluster bombardment in the electronic stopping-power regime.

Single crystals of magnesium oxide containing nanoprecipitates of sodium were bombarded with swift ions ~;GeV-Pb, U! or cluster beams ~;20 MeV-C60! to study the phase change induced by electronic processes at high stopping power ~.10 keV/nm!. The sodium precipitates and the defect creation were characterized by optical absorption and transmission electron microscopy. The ion or cluster bombardm...

Voltage increase of aqueous lithium-ion batteries by Li-ion conducting Li1.5Al0.5Ge1.5(PO4)3 glass-ceramic

  In this research, a lithium ion conducting lithium aluminum germanium phosphate (LAGP) glass-ceramic with a formula of Li1.5Al0.5Ge1.5(PO4)3 was synthesized by melt-quenching method and subsequent crystallization at 850 °C for 8 h. The prepared glass-ceramic was characterized using X-ray diffraction analysis (XRD) and field emission scanning electron microscopy (FESEM). The XRD patterns exhib...